DocumentCode :
2074059
Title :
Numerical modeling and measurements on the shielding effectiveness of enclosure with apertures
Author :
Kwon, Jong Hwa ; Choi, Hyung-Do ; Park, Hyun H. ; Yook, Jong Gwan
Author_Institution :
Radio & Broadcasting Res. Div., ETRI, Daejeon
fYear :
2008
fDate :
19-23 May 2008
Firstpage :
887
Lastpage :
890
Abstract :
Generally, most of the electronic equipments need a metallic enclosure in order to mechanically protect and to electrically shield the interior printed circuit boards (PCBs) and subsystems. But in the practical situations, the apertures or slots of various forms are essential parts of the shielding enclosure for heat dissipation, CD-ROMs, connectors, I/O cabling and so on. The performance of shielding enclosures for high-speed digital systems is compromised by those inevitable discontinuities on enclosure. To minimize the electromagnetic interference and susceptibility risk by those discontinuities, the shielding enclosures with apertures should be designed based on the thorough analysis about the electromagnetic coupling mechanism through apertures. In this paper, the effect of apertures on shielding effectiveness of the enclosure is studied with the finite-difference time-domain (FDTD) method. And the simulated SE data are verified numerically and experimentally. Good agreements are seen. Also several guidelines on the apertures design of shielding enclosure are verified with the numerical methods.
Keywords :
electromagnetic coupling; electromagnetic interference; electromagnetic shielding; electronic equipment testing; finite difference time-domain analysis; printed circuits; electromagnetic coupling mechanism; electromagnetic interference; electromagnetic susceptibility risk; electronic equipments; finite-difference time-domain method; high-speed digital systems; interior printed circuit boards; shielding effectiveness; Apertures; Cable shielding; Connectors; Digital systems; Electronic equipment; Finite difference methods; Numerical models; Printed circuits; Protection; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
Type :
conf
DOI :
10.1109/APEMC.2008.4560018
Filename :
4560018
Link To Document :
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