DocumentCode
2074103
Title
Simultaneous ODF estimation and tractography in HARDI
Author
Cetingul, H.E. ; Nadar, M. ; Thompson, Paul ; Sapiro, Guillermo ; Lenglet, Christophe
Author_Institution
Corp. Res. & Technol., Siemens Corp., Princeton, NJ, USA
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
86
Lastpage
89
Abstract
We consider the problem of tracking white matter fibers in high angular resolution diffusion imaging (HARDI) data while simultaneously estimating the local fiber orientation profile. Prior work showed that an unscented Kalman filter (UKF) can be used for this problem, yet existing algorithms employ parametric mixture models to represent water diffusion and to define the state space. To address this restrictive model dependency, we propose to extend the UKF to HARDI data modeled by orientation distribution functions (ODFs), a more generic diffusion model. We consider the spherical harmonic representation of the HARDI signal as the state, enforce nonnegativity of the ODFs, and perform tractography using the directions at which the ODFs attain their peaks. In simulations, our method outperforms filtered two-tensor tractography at different levels of noise by achieving a reduction in mean Chamfer error of 0.05 to 0.27 voxels; it also produced in vivo fiber tracking that is consistent with the neuroanatomy.
Keywords
Kalman filters; biomedical MRI; brain; medical signal processing; HARDI data; HARDI signal spherical harmonic representation; ODF estimation; generic diffusion model; high angular resolution diffusion imaging; local fiber orientation profile estimation; neuroanatomy; orientation distribution functions; tractography; unscented Kalman filter; white matter fiber tracking; Accuracy; Imaging; Kalman filters; Signal to noise ratio; Tensile stress; Xenon; Diffusion Tensor Imaging; Humans; Models, Theoretical; Nerve Net; Sensitivity and Specificity;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6345877
Filename
6345877
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