Title :
A Concept Similarity Method in Structural and Semantic Levels
Author :
Yan, Sheng ; Li Yun ; Luan, Luan
Author_Institution :
Inst. of Inf. Eng., Yang Zhou Univ., Yang Zhou, China
Abstract :
Based on the formal concept analysis, combining the rough set and semantic ontology, this paper proposes a formal concept similarity measurement by improving the original Tversky similarity model. The method used the hierarchical information of concept lattice in the lattice structure and its own semantic meaning to measure the similarity of from the structure information of the concepts and semantic information respectively, which reflect the true similarity of formal concept to some extent.
Keywords :
data analysis; ontologies (artificial intelligence); rough set theory; Tversky similarity model; concept similarity method; data analysis technique; formal concept analysis; formal concept similarity measurement; lattice structure; rough set theory; semantic levels; semantic ontology; Artificial intelligence; Data analysis; Fellows; Information analysis; Information science; Lattices; Ontologies; Set theory; concept similarity; formal concept analysis; hierarchical information; semantic;
Conference_Titel :
Information Science and Engineering (ISISE), 2009 Second International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-6325-1
Electronic_ISBN :
978-1-4244-6326-8
DOI :
10.1109/ISISE.2009.133
