DocumentCode :
2074112
Title :
Solder joint formation simulation and finite element analysis
Author :
Mui, Gary K. ; Wu, Xiaohua ; Hu, Kai X. ; Yeh, Chao-pin ; Wyatt, Karl
Author_Institution :
Motorola Inc., Schaumburg, IL, USA
fYear :
1997
fDate :
18-21 May 1997
Firstpage :
436
Lastpage :
443
Abstract :
The solder joint formation during reflow and related subsequent solder joint reliability of surface mounted electronic devices are critical issues in the field of electronic packaging. Solder joint reflow and reliability are highly dependent on joint configuration which are governed by bond pad size, alloy material, solder paste volume, leadframe geometry, and leadframe/pad alignment, etc. The objective of this work is to develop numerical models and methods to: (1) simulate the solder joint formation during the reflow process; (2) determine the stress/strain distribution within the joint; and (3) further predict the reliability of the solder joints. The solder joint formation process during the solidification stage can be simulated using the Surface Evolver program developed by University of Minnesota. The thermomechanical force/displacement (or stress/strain) analysis can be carried out using ANSYS, a general purpose Finite Element Analysis program. The effort also includes the linking of the two programs. Examples of applications of this work include study of components falling off during second (facing down) reflow and thermal stress analysis (due to CTE mismatch) of PQFP mounted on FR4 PWB
Keywords :
circuit reliability; electronic engineering computing; finite element analysis; integrated circuit packaging; reflow soldering; stress analysis; stress-strain relations; surface mount technology; thermal analysis; thermal stresses; ANSYS program; FEA program; SMD; Surface Evolver program; alloy material; bond pad size; electronic packaging; finite element analysis; joint configuration; leadframe geometry; leadframe/pad alignment; numerical models; solder joint formation simulation; solder joint reliability; solder paste volume; solder reflow; solidification stage; stress/strain analysis; stress/strain distribution; surface mounted electronic devices; thermal stress analysis; thermomechanical force; Analytical models; Bonding; Capacitive sensors; Electronics packaging; Finite element methods; Joining materials; Lead; Materials reliability; Soldering; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location :
San Jose, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-3857-X
Type :
conf
DOI :
10.1109/ECTC.1997.606207
Filename :
606207
Link To Document :
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