DocumentCode :
2074175
Title :
Pulsed-latch ASIC synthesis in industrial design flow
Author :
Sangmin Kim ; Duckhwan Kim ; Youngsoo Shin
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2013
fDate :
22-25 Jan. 2013
Firstpage :
356
Lastpage :
361
Abstract :
Flip-flop has long been used as a sequencing element of choice in ASIC design; commercial synthesis tools have also been developed in this context. This work has been motivated by a question of whether existing CAD tools can be employed from RTL to layout while pulsed latch replaces flip-flop as a sequencing element. Two important problems have been identified and their solutions are proposed: placement of pulse generators and latches for integrity of pulse shape, and design of special scan latches and their selective use to reduce hold violations. A reference design flow has also been set up using published documents, in order to assess the proposed one. In 40-nm technology, the proposed flow achieves 20% reduction in circuit area and 30% reduction in power consumption, on average of 12 test circuits.
Keywords :
application specific integrated circuits; flip-flops; integrated circuit layout; pulse generators; CAD tools; RTL; flip-flop; industrial design flow; integrated circuit layout; pulse generator placement; pulse shape integrity; pulsed latch ASIC synthesis; reduce hold violation; scan latch; sequencing element; size 40 nm; Application specific integrated circuits; Clocks; Delays; Generators; Latches; Pulse generation; Standards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4673-3029-9
Type :
conf
DOI :
10.1109/ASPDAC.2013.6509621
Filename :
6509621
Link To Document :
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