DocumentCode :
2074240
Title :
An exploratory study of fault-proneness in evolving aspect-oriented programs
Author :
Ferrari, Fabiano ; Burrows, Rachel ; Lemos, Otávio ; Garcia, Alessandro ; Figueiredo, Eduardo ; Cacho, Nelio ; Lopes, Frederico ; Temudo, Nathalia ; Silva, Liana ; Soares, Sergio ; Rashid, Awais ; Masiero, Paulo ; Batista, Thais ; Maldonado, José
Author_Institution :
Comput. Syst. Dept., Univ. of Sao Paulo-USP, Sao Carlos, Brazil
Volume :
1
fYear :
2010
fDate :
2-8 May 2010
Firstpage :
65
Lastpage :
74
Abstract :
This paper presents the results of an exploratory study on the fault-proneness of aspect-oriented programs. We analysed the faults collected from three evolving aspect-oriented systems, all from different application domains. The analysis develops from two different angles. Firstly, we measured the impact of the obliviousness property on the fault-proneness of the evaluated systems. The results show that 40% of reported faults were due to the lack of awareness among base code and aspects. The second analysis regarded the fault-proneness of the main aspect-oriented programming (AOP) mechanisms, namely pointcuts, advices and intertype declarations. The results indicate that these mechanisms present similar fault-proneness when we consider both the overall system and concern-specific implementations. Our findings are reinforced by means of statistical tests. In general, this result contradicts the common intuition stating that the use of pointcut languages is the main source of faults in AOP.
Keywords :
aspect-oriented programming; program testing; programming languages; software fault tolerance; statistical testing; aspect-oriented programming mechanisms; aspect-oriented systems; fault-proneness; intertype declarations; pointcut languages; statistical tests; Educational institutions; Fault diagnosis; Java; Programming; Software; Taxonomy; Testing; aspect-oriented programming; fault-proneness; software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering, 2010 ACM/IEEE 32nd International Conference on
Conference_Location :
Cape Town
ISSN :
0270-5257
Print_ISBN :
978-1-60558-719-6
Type :
conf
DOI :
10.1145/1806799.1806813
Filename :
6062074
Link To Document :
بازگشت