DocumentCode :
2074366
Title :
Design issues in heterogeneous 3D/2.5D integration
Author :
Milojevic, Dragomir ; Marchal, P. ; Marinissen, Erik Jan ; Van der Plas, G. ; Verkest, D. ; Beyne, Eric
Author_Institution :
IMEC, Leuven, Belgium
fYear :
2013
fDate :
22-25 Jan. 2013
Firstpage :
403
Lastpage :
410
Abstract :
Efficient processing of fine-pitched Through Silicon Vias, micro-bumps and back-side re-distribution layers enable face-to-back or face-to-face integration of heterogeneous ICs using 3D stacking and/or Silicon Interposers. While these technology features are extremely compelling, they considerably stress the existing design practices and EDA tool flows typically conceived for 2D systems. With all system, technology and implementation level options brought with these features, the design space increases to an extent where traditional 2D tools cannot be used any more for efficient exploration. Therefore, the cost-effective design of future 3D ICs products will require new planning and co-optimisation techniques and tools that are fast and accurate enough to cope with these challenges. In this paper we present design methodology and the practical EDA tool chain that covers different aspects of the design flow and is specific to efficient design of 3D-ICs. Flow features include: fast synthesis and 3D design partitioning at gate level, TSV/micro-bump array planning, 3D floor planning, placement and routing, congestion analysis, fast thermal and mechanical modeling, easy technology vs. implementation trade-off analysis, 3D device models generations and Design-for-Test (DfT). The application of the tool chain is illustrated using concrete example of a real-world design, showing not only the applicability of the tool chain, but also the benefits of heterogeneous 2.5 and 3D integration technologies.
Keywords :
design for testability; fine-pitch technology; integrated circuit layout; integrated circuit modelling; network routing; silicon; three-dimensional integrated circuits; 2D systems; 3D design partitioning; 3D device models generations; 3D floor planning; 3D stacking; DfT; EDA tool chain; TSV array planning; back-side redistribution layers; congestion analysis; cooptimisation techniques; cost-effective design; design flow; design issues; design methodology; design practices; design space; design-for-test; face-to-back integration; face-to-face integration; fine-pitched through silicon vias; future 3D IC products; gate level; heterogeneous 2.5 integration technology; heterogeneous 3D integration technology; heterogeneous 3D/2.5D integration; heterogeneous IC; implementation trade-off analysis; mechanical modeling; microbump array planning; microbumps; placement and routing; planning techniques; real-world design; silicon interposers; thermal modeling; Planning; Random access memory; Routing; Silicon; Standards; Three-dimensional displays; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4673-3029-9
Type :
conf
DOI :
10.1109/ASPDAC.2013.6509630
Filename :
6509630
Link To Document :
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