• DocumentCode
    2074462
  • Title

    Optimizing routability in large-scale mixed-size placement

  • Author

    Cong, J. ; Guojie Luo ; Tsota, K. ; Bingjun Xiao

  • Author_Institution
    Comput. Sci. Dept., Univ. of California, Los Angeles, Los Angeles, CA, USA
  • fYear
    2013
  • fDate
    22-25 Jan. 2013
  • Firstpage
    441
  • Lastpage
    446
  • Abstract
    One of the necessary requirements for the placement process is that it should be capable of generating routable solutions. This paper describes a simple but effective method leading to the reduction of the routing congestion and the final routed wirelength for large-scale mixed-size designs. In order to reduce routing congestion and improve routability, we propose blocking narrow regions on the chip. We also propose dummy-cell insertion inside regions characterized by reduced fixed-macro density. Our placer consists of three major components: (i) narrow channel reduction by performing neighbor-based fixed-macro inflation; (ii) dummy-cell insertion inside large regions with reduced fixed-macro density; and (iii) pre-placement inflation by detecting tangled logic structures in the netlist and minimizing the maximum pin density. We evaluated the quality of our placer using the newly released DAC 2012 routability-driven placement contest designs and we compared our results to the top four teams that participated in the placement contest. The experimental results reveal that our placer improves the routability of the DAC 2012 placement contest designs and effectively reduces the routing congestion.
  • Keywords
    VLSI; integrated circuit design; network routing; DAC 2012 routability-driven placement contest designs; Design Automation Conference; VLSI placement; blocking narrow regions; dummy-cell insertion; large-scale mixed-size designs; large-scale mixed-size placement process; narrow channel reduction; neighbor-based fixed-macroinflation; reduced fixed-macro density; routability optimization; routing congestion reduction; tangled logic structure detection; Conferences; Design automation; Educational institutions; Measurement; Routing; Runtime; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-3029-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2013.6509636
  • Filename
    6509636