• DocumentCode
    2074513
  • Title

    Simulation of nanodimensional matrix field-emission cathode

  • Author

    Kurayev, A.A. ; Lukashevich, D.V. ; Sinitsyn, A.K.

  • Author_Institution
    Dept. of Inf. & Radioelectron., Byelorussian State Univ., Minsk, Byelorussia
  • fYear
    2000
  • fDate
    2-4 May 2000
  • Abstract
    Field-emission cathodes (F-ECs) are widely used in various fields of science and technology. There are different methods to produce F-ECs, while the latest trends are focused on an optimization of their design and decreasing the size in order to reduce the operating voltage. The developed technologies enables to vary easily the grid dimensions, tip radius and rounding-off angle, tip height relative to the control electrode, tips-to-control electrode spacing. It is necessary to know at manufacturing F-ECs how the geometry of the cathode influences their characteristics. To this end, we present the adequate mathematical simulation of field-emission triode structures enabling us to optimize their geometry according to the given figure of merit, in particular, on the basis of minimum electron velocity angular distribution. Theoretical simulation procedure and related computer program were developed for simulation of F-ECs. Mathematical modeling of the electrostatic field and electron paths, account of the interelectrode capacitances are executed in F-ECs. The simulation of electrical characteristics of F-ECs with a control electrode (grid) is performed to optimize their geometry according to desired field amplification factor on the basis of minimum electron velocity angular distribution.
  • Keywords
    nanotechnology; vacuum microelectronics; electron paths; electrostatic field; field-emission cathodes; grid dimensions; minimum electron velocity angular distribution; nanodimensional matrix field-emission cathode; operating voltage; rounding-off angle; tip height; tip radius; tips-to-control electrode spacing; Cathodes; Computational modeling; Computer simulation; Design optimization; Electrodes; Electrons; Geometry; Manufacturing; Solid modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2000. Abstracts. International
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-5987-9
  • Type

    conf

  • DOI
    10.1109/OVE:EC.2000.847446
  • Filename
    847446