Title :
Simulation of nanodimensional matrix field-emission cathode
Author :
Kurayev, A.A. ; Lukashevich, D.V. ; Sinitsyn, A.K.
Author_Institution :
Dept. of Inf. & Radioelectron., Byelorussian State Univ., Minsk, Byelorussia
Abstract :
Field-emission cathodes (F-ECs) are widely used in various fields of science and technology. There are different methods to produce F-ECs, while the latest trends are focused on an optimization of their design and decreasing the size in order to reduce the operating voltage. The developed technologies enables to vary easily the grid dimensions, tip radius and rounding-off angle, tip height relative to the control electrode, tips-to-control electrode spacing. It is necessary to know at manufacturing F-ECs how the geometry of the cathode influences their characteristics. To this end, we present the adequate mathematical simulation of field-emission triode structures enabling us to optimize their geometry according to the given figure of merit, in particular, on the basis of minimum electron velocity angular distribution. Theoretical simulation procedure and related computer program were developed for simulation of F-ECs. Mathematical modeling of the electrostatic field and electron paths, account of the interelectrode capacitances are executed in F-ECs. The simulation of electrical characteristics of F-ECs with a control electrode (grid) is performed to optimize their geometry according to desired field amplification factor on the basis of minimum electron velocity angular distribution.
Keywords :
nanotechnology; vacuum microelectronics; electron paths; electrostatic field; field-emission cathodes; grid dimensions; minimum electron velocity angular distribution; nanodimensional matrix field-emission cathode; operating voltage; rounding-off angle; tip height; tip radius; tips-to-control electrode spacing; Cathodes; Computational modeling; Computer simulation; Design optimization; Electrodes; Electrons; Geometry; Manufacturing; Solid modeling; Voltage;
Conference_Titel :
Vacuum Electronics Conference, 2000. Abstracts. International
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5987-9
DOI :
10.1109/OVE:EC.2000.847446