Synthesizing multiple scan chains by cost-driven spectral ordering

Power cost and wire cost are two most critical issues in scan-chain optimization for modern VLSI testing. Many previous works used layout-based partitioning and greedy heuristics to synthesize multiple scan chains, making themselves suffer from (1) cost-metric monotonicity and (2) crossing-edge problem. Therefore, in this paper, we propose cost-driven spectral ordering including (1) cost-driven k-way spectral partitioning and (2) greedy non-crossing 2-opt ordering to resolve two above problems, respectively. Experiments show that different cost metrics can be properly addressed in k-way spectral partitioning. Moreover, our cost-driven spectral ordering achieves averagely 9% mixed (power-and-wire) reduction than two previous works on benchmark circuits, which evidently demonstrates its effectiveness on multiple scan-chain synthesis.