Title :
Optimization of flexible substrate for COF (chip on flexible) LED packaging
Author :
Kim, Young-Woo ; Park, Sung-Mo ; Kim, Min-Sung ; Kim, Jae-Pil ; Kim, Jae-Bum ; Song, Sang-Bin ; Lim, Yeong-Seog
Author_Institution :
Solid State Lighting Team, Korea Photonics Technol. Inst., Gwangju
Abstract :
The poor thermal design of high brightness light-emitting diodes (HB-LEDs) package for the automotive exterior lighting system causes the degradation of the optical and reliability performance, also the deterioration of the cost-effectiveness. We design the flexible package substrate with the thick heat-spreading layer and thermal via-hole fully filled with the copper (FFC) for the conventional process of flexible printed circuit board (FPCB) and the extraction methodology of the heat flow is presented. Effective heat flow for thermal simulation is compensated for the optical loss between the internal and external quantum efficiency. The vertical blue LED is attached on metal core printed circuit board (MCPCB) without the molding process, and then heat distribution and optical power is, respectively, measured by using infrared camera and optical LED tester as increasing the magnitude of the input power. Detailed thermal performance of FPCB and MCPCB is verified with the heat distribution and the thermal resistance. The effects of the main factors of FPCB with filled via-holes are discussed using design of experiment (DOE) methodology. The thermal resistance and junction temperature of FPCB is, respectively, over two times and 10 degC lower than that of MCPCB.
Keywords :
automotive electronics; chip-on-board packaging; copper; design of experiments; flexible electronics; infrared imaging; light emitting diodes; lighting; optical losses; printed circuits; thermal management (packaging); thermal resistance; COF; FPCB junction temperature; FPCB thermal performance; HB-LED package; MCPCB thermal performance; automotive exterior lighting system; chip-on-flexible LED packaging; copper; design of experiment methodology; external quantum efficiency; extraction methodology; flexible printed circuit board; flexible substrate optimization; heat distribution; heat flow; high brightness light-emitting diode; infrared camera; internal quantum efficiency; metal core printed circuit board; optical degradation; optical loss; optical power measurement; reliability performance; temperature 10 C; thermal design; thermal resistance; thermal simulation; thick heat-spreading layer; vertical blue LED; Automotive engineering; Brightness; Circuit testing; Flexible printed circuits; Infrared heating; Light emitting diodes; Optical design; Packaging; Thermal degradation; Thermal resistance;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074288