DocumentCode :
2075113
Title :
Factors in implementing MCM solutions for the high performance systems of the 1990s
Author :
Buschbom, Milton L. ; Calvin, Sam E.
Author_Institution :
Texas Instrum., Dallas, TX, USA
fYear :
1991
fDate :
12-15 May 1991
Abstract :
It is pointed out that the ability to package VLSI and ULSI circuits in a manner that causes minimum degradation to circuit performance and still meet the desired form-factors in the final system is a key challenge for the 1990s. Conventional packaging configurations are giving way to next-generation solutions with increased emphasis on interconnection technology, thermal management, mechanical issues, and board footprint. Processor roadmaps show 4× to 5× increases in operating frequency over the next five years, and commercial optical systems at 300 MHz are followed by lob versions operating at 1 GHz. Electronic system performance driving factors are discussed, and the resulting constraints for semiconductors, interconnection techniques (including tape automated bond and flip chip), mechanical design, and thermal approaches are addressed. Additional integration of VLSI and ULSI components in the form of modular systems solutions at the multichip module (MCM) level are being developed and produced at the laboratory level, and results are discussed
Keywords :
VLSI; flip-chip devices; hybrid integrated circuits; packaging; tape automated bonding; ULSI; VLSI; board footprint; circuit performance; degradation; flip chip; form-factors; interconnection technology; lob versions; mechanical issues; multichip module; operating frequency; packaging configurations; tape automated bond; thermal management; Circuit optimization; Electronic packaging thermal management; Frequency; Integrated circuit interconnections; Optical interconnections; Technology management; Thermal degradation; Thermal management; Ultra large scale integration; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1991., Proceedings of the IEEE 1991
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0015-7
Type :
conf
DOI :
10.1109/CICC.1991.164052
Filename :
164052
Link To Document :
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