Title :
Full-Wave Investigation of Leakage from a Covered Microstrip Line with Finite Strip Conductivity and Thickness
Author :
Tzuang, Ching-Kuang C. ; Tien, Ching-Cheng ; Chan, Kuan-Kin
Author_Institution :
Institute of Communication Engineering and Microelectronics & Information Science Research Center, National Chiao-Tung University, Hsinchu, Taiwan, R.O.C.
Abstract :
A network representation of full-wave mode-matching method employing the metal modes is applied to the investigation of the leaky wave from a covered microstrip line with finite metalized strip conductivity and thickness. The theoretical results are in good agreement with the published data for both dominant mode and leaky wave cases. The effects of finite metalized conductivity and thickness on the first odd mode leaky wave are investigated and reported rigorously.
Keywords :
Circuits; Conductivity; Conductors; Frequency; Microstrip; Microwave propagation; Mode matching methods; Propagation constant; Propagation losses; Strips;
Conference_Titel :
Microwave Conference, 1990. 20th European
Conference_Location :
Budapest, Hungary
DOI :
10.1109/EUMA.1990.336099