DocumentCode :
2075229
Title :
A unique application of decapsulation combining laser and plasma
Author :
Thomas, Jason ; Baer, Jacob ; Westby, Philip ; Mattson, Kevin ; Haring, Frederik ; Strommen, Greg ; Jacobson, John ; Ahmad, Sabarinah Sh ; Reinholz, Aaron
Author_Institution :
Center for Nanoscale Sci. & Eng., North Dakota State Univ., Fargo, ND
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
2011
Lastpage :
2015
Abstract :
Often the greatest cost for developing a new package or system is the acquisition of bare chips. To meet this challenge, a unique technique involving laser and plasma has been developed for extracting dice or chips for reuse and repackaging. Epoxy molded integrated circuit (IC) packages are decapsulated using a combination of a neodymium-doped yttrium aluminum garnet (YAG) laser and reactive ion etch (RIE) plasma etcher. Using the parameters mentioned in this paper, a yield of over 70% of functional packages was achieved at the end of decapsulation.
Keywords :
electronics packaging; failure analysis; laser beam applications; sputter etching; YAG laser; decapsulation; epoxy molded integrated circuit packages; reactive ion etch plasma etcher; Chemical lasers; Etching; Gas lasers; Integrated circuit packaging; Laser ablation; Laser theory; Optical materials; Plasma applications; Power lasers; Surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074298
Filename :
5074298
Link To Document :
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