DocumentCode :
2075451
Title :
Modeling study of the mobility in FDSOI devices with a focus on near-spacer-region
Author :
Pereira, F.G. ; Rideau, D. ; Nier, O. ; Tavernier, C. ; Triozon, F. ; Garetto, D. ; Mugny, G. ; Sklenard, B. ; Hiblot, G. ; Pala, M.
Author_Institution :
STMicroelectron., Crolles, France
fYear :
2015
fDate :
26-28 Jan. 2015
Firstpage :
49
Lastpage :
52
Abstract :
We have studied the mobility in the FDSOI devices as a function of silicon thickness, doping, surface orientation and applying different back biases. This study is also done in the near-spacer-region that is partially inverted. Simulations have been obtained with a self-consistent Poisson-Schrödinger which provides a precise energy distribution of carriers and, allied to a Kubo-Greenwood carrier mobility solver, performs a quantum corrected drift diffusion (QCDD) model, capable of capturing non local effects on transport (tunneling) and mobility (influence of geometry).
Keywords :
carrier mobility; elemental semiconductors; semiconductor device models; semiconductor doping; silicon; silicon-on-insulator; FDSOI devices; Kubo-Greenwood carrier mobility solver; QCDD model; back bias; doping; energy distribution; mobility modeling study; near-spacer-region; nonlocal effect capturing; quantum corrected drift diffusion model; self-consistent Poisson-Schrodinger; silicon thickness function; surface orientation; Doping; Electrostatics; Mathematical model; Performance evaluation; Scattering; Semiconductor process modeling; Silicon; FDSOI; Kubo-Greenwood; Poisson-Schrödinger; QCDD; mobility; transport;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultimate Integration on Silicon (EUROSOI-ULIS), 2015 Joint International EUROSOI Workshop and International Conference on
Conference_Location :
Bologna
Type :
conf
DOI :
10.1109/ULIS.2015.7063770
Filename :
7063770
Link To Document :
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