DocumentCode :
2075501
Title :
Thermal-reliable 3D clock-tree synthesis considering nonlinear electrical-thermal-coupled TSV model
Author :
Yang Shang ; Chun Zhang ; Hao Yu ; Chuan Seng Tan ; Xin Zhao ; Sung Kyu Lim
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2013
fDate :
22-25 Jan. 2013
Firstpage :
693
Lastpage :
698
Abstract :
3D physical design needs accurate device model of through-silicon vias (TSVs). In this paper, physics-based electrical-thermal model is introduced for both signal and dummy thermal TSVs with the consideration of nonlinear electrical-thermal dependence. Taking thermal-reliable 3D clock-tree synthesis as a case-study to verify the effectiveness of the proposed TSV model, one nonlinear programming-based clock-skew reduction problem is formulated to allocate thermal TSVs for clock-skew reduction under non-uniform temperature distribution. With a number of 3D clock-tree benchmarks, experiments show that under the nonlinear electrical-thermal TSV model, insertion of thermal TSVs can effectively reduce temperature-gradient introduced clock-skew by 58.4% on average, and has 11.6% higher clock-skew reduction than the result under linear electrical-thermal model.
Keywords :
integrated circuit modelling; integrated circuit reliability; nonlinear programming; temperature distribution; three-dimensional integrated circuits; 3D clock-tree benchmarks; 3D physical design; device model; dummy thermal TSV; linear electrical-thermal model; nonlinear electrical-thermal TSV model; nonlinear electrical-thermal dependence; nonlinear electrical-thermal-coupled TSV model; nonlinear programming-based clock-skew reduction problem; nonuniform temperature distribution; physics-based electrical-thermal model; thermal-reliable 3D clock-tree synthesis; through-silicon vias; Clocks; Delays; Solid modeling; Temperature dependence; Temperature distribution; Three-dimensional displays; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4673-3029-9
Type :
conf
DOI :
10.1109/ASPDAC.2013.6509681
Filename :
6509681
Link To Document :
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