DocumentCode :
2075503
Title :
Packaging effects on a CMOS low-noise amplifier: Flip-chip versus wirebond
Author :
Lu, K.-C. ; Han, F.Y. ; Horng, T.S. ; Lin, J. ; Cheng, H.-H. ; Chiu, C.T. ; Hung, C.P.
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
2064
Lastpage :
2069
Abstract :
A model-based study is presented to compare the effects between flip-chip and wirebond package on a low-noise amplifier (LNA) in a 2.4 GHz CMOS wireless local area network (WLAN) receiver. To construct the package electrical models, specific modeling dies are designed to help extract the equivalent-circuit parameters from measured S-parameters for chip-package interconnects. Furthermore, the ground proximity effects on on-chip spiral inductors in a flip-chip package are also modeled in this study. Excellent agreement between modeling and measurement is obtained up to 20 GHz for a 64-pin flip-chip ball grid array (FCBGA) package and a 64-pin wirebond quad flat nonlead (QFN) package. In practical applications, the established package models are used to predict the RF specifications of a 2.4 GHz CMOS LNA when packaged in the above two packages. Consequently, chip-package co-simulation achieves a good agreement with measurement, and thus can persuasively account for the effects caused by the two different packages.
Keywords :
CMOS integrated circuits; S-parameters; ball grid arrays; chip scale packaging; equivalent circuits; flip-chip devices; integrated circuit interconnections; lead bonding; low noise amplifiers; microassembling; wireless LAN; CMOS low-noise amplifier; CMOS wireless local area network receiver; S-parameters; bandwidth 2.4 GHz; chip-package co-simulation; chip-package interconnects; dies; equivalent-circuit parameters; flip-chip ball grid array package; frequency 20 GHz; ground proximity effects; on-chip spiral inductors; package electrical models; wirebond quad flat nonlead package; Electric variables measurement; LAN interconnection; Low-noise amplifiers; Packaging; Proximity effect; Scattering parameters; Semiconductor device measurement; Semiconductor device modeling; Spirals; Wireless LAN;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074308
Filename :
5074308
Link To Document :
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