Title :
Energy recovery clocking scheme and flip-flops for ultra low-energy applications
Author :
Cooke, Matthew ; Mahmoodi-Meimand, Hamid ; Roy, Kaushik
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
A significant fraction of the total power in highly synchronous systems is dissipated over clock networks. Hence, low-power clocking schemes would be promising approaches for future designs. We propose four novel energy recovery flip-flops that enable energy recovery from the clock network, resulting in significant energy savings. The proposed flip-flops operate with a single-phase sinusoidal clock, which can be generated with high efficiency. Based on the simulation results using TSMC 0.25 μm CMOS process technology, at a frequency of 200 MHz, the proposed flip-flops exhibit more than 80% delay reduction, power reduction of up to 46%, and area reduction of up to 77%, as compared to the conventional energy recovery flip-flop. We implemented 1024 proposed energy recovery flip-flops through an H-tree clock network driven by a resonant clock-generator that generates a sinusoidal clock. Results show a power reduction of 90% on the clock-tree and total power savings of up to 83% as compared to the same implementation using the conventional square-wave clocking scheme and flip-flops.
Keywords :
CMOS logic circuits; clocks; flip-flops; integrated circuit design; logic design; logic simulation; low-power electronics; 0.25 micron; 200 MHz; CMOS; H-tree clock network; area reduction; clock network power dissipation; delay reduction; energy recovery clocking scheme; energy recovery flip-flops; low-power clocking schemes; power reduction; resonant clock-generator; single-phase sinusoidal clock; synchronous systems; ultra low-energy applications; Application software; Circuits; Clocks; Delay; Energy consumption; Flip-flops; Frequency; Microprocessors; Permission; Very large scale integration;
Conference_Titel :
Low Power Electronics and Design, 2003. ISLPED '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
1-58113-682-X
DOI :
10.1109/LPE.2003.1231835