• DocumentCode
    2075639
  • Title

    Reviving erroneous stability-based clock-gating using partial Max-SAT

  • Author

    Bao Le ; Sengupta, Dipak ; Veneris, Andreas

  • Author_Institution
    ECE Dept., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2013
  • fDate
    22-25 Jan. 2013
  • Firstpage
    717
  • Lastpage
    722
  • Abstract
    The conflicting yet increasing demand for high performance and low power in multi-functional chips has pushed techniques for power reduction to the forefront of VLSI design. Although recent developments have automated most of the low power implementations, designers often manually modify the circuit in order to achieve further power savings. This human intervention is often paved with many errors that are bound to typical logic functional failures. Debugging these errors can be a resource intensive process that requires considerable manual effort. This discourages engineers and achieving power savings at the micro level of the design sometimes remains unrealized. This paper proposes a novel debugging methodology to rectify erroneous clock-gating implementations. With the use of Partial Max-SAT, the method localizes and rectifies the design error introduced in the circuit during a clock-gating implementation. The net effect of the proposed methodology leads to shorter debug time ensuring additional power savings. Extensive experiments on benchmark circuits confirm the effectiveness of the approach.
  • Keywords
    VLSI; integrated circuit design; integrated circuit testing; VLSI design; benchmark circuit; clock gating; clock-gating; erroneous stability; error debugging; logic functional failure; multifunctional chip; partial Max-SAT; power reduction; power saving; resource intensive process; Circuit stability; Clocks; Debugging; Logic gates; Power demand; Registers; Runtime; Clock Gating; Debugging; Design Errors; Low Power design; Max-SAT; Stability Condition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-3029-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2013.6509685
  • Filename
    6509685