DocumentCode :
2075783
Title :
Sequential Error Rate evaluation of SSVEP classification problem with Bayesian sequential learning
Author :
Hara, Hideyuki ; Takemoto, Atsushi ; Dobashi, Yumi ; Nakamura, Katsuki ; Matsumoto, Takashi
Author_Institution :
Dept. of Electr. Eng. & Biosci., Waseda Univ., Tokyo, Japan
fYear :
2010
fDate :
3-5 Nov. 2010
Firstpage :
1
Lastpage :
5
Abstract :
An attempt was made to evaluate the Sequential Error Rate (SER) of an SSVEP classification problem with a Bayesian sequential learning algorithm. Sequential Error Rate refers to the average classification error rate windowed over a short trial period. The algorithm was implemented by the Sequential Monte Carlo method. As opposed to the batch learning algorithm, the sequential learning algorithm does not divide the data into training and test datasets; rather, it starts learning with the first single trial data and proceeds with the learning sequentially using the rest of the data. The algorithm was tested against an SSVEP classification problem. The algorithm appeared functional.
Keywords :
Bayes methods; Monte Carlo methods; brain-computer interfaces; electroencephalography; learning (artificial intelligence); Bayesian sequential learning; SSVEP classification problem; Sequential Monte Carlo method; batch learning algorithm; sequential error rate evaluation; Time frequency analysis; Visualization; Bayesian learning; Brain-computer interface(BCI); Sequential Monte Carlo; electroencephalography(EEG); sequential learning; steady-state visual evoked potential(SSVEP);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology and Applications in Biomedicine (ITAB), 2010 10th IEEE International Conference on
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-6559-0
Type :
conf
DOI :
10.1109/ITAB.2010.5687773
Filename :
5687773
Link To Document :
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