DocumentCode
2075896
Title
Optimizing genetic algorithm parameters for multiple fault diagnosis applications
Author
Juric, Mark
Author_Institution
Artificial Intelligence Programs, Georgia Univ., Athens, GA, USA
fYear
1994
fDate
1-4 Mar 1994
Firstpage
434
Lastpage
440
Abstract
Multiple fault diagnosis (MFD) is the process of determining the correct fault or faults that are responsible for a given set of symptoms. Exhaustive searches or statistical analyses are usually too computationally expensive to solve these types of problems in real-time. We use a simple genetic algorithm to significantly reduce the time required to evolve a satisfactory solution. We show that when using genetic algorithms to solve these kinds of applications, best results are achieved with higher than “normal” mutation rates. Schemata theory is used to analyze this data and show that even though schema length increases, the Hamming distance between binary representations of best-fit chromosomes is quite small. Hamming distance is then related to schema length to show why mutation rate becomes important in this type of application
Keywords
failure analysis; genetic algorithms; optimisation; search problems; statistical analysis; Hamming distance; best-fit chromosomes; binary representations; genetic algorithm parameters; multiple fault diagnosis applications; mutation rates; satisfactory solution; schema length; schemata theory; simple genetic algorithm; statistical analyses; Acoustic noise; Artificial intelligence; Bayesian methods; Biological cells; Data analysis; Fault diagnosis; Genetic algorithms; Genetic mutations; Petroleum; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Artificial Intelligence for Applications, 1994., Proceedings of the Tenth Conference on
Conference_Location
San Antonia, TX
Print_ISBN
0-8186-5550-X
Type
conf
DOI
10.1109/CAIA.1994.323643
Filename
323643
Link To Document