DocumentCode :
2076062
Title :
Transparent combination of expert and measurement data for defect prediction: an industrial case study
Author :
Kläs, Michael ; Elberzhager, Frank ; Münch, Jürgen ; Hartjes, Klaus ; Von Graevemeyer, Olaf
Author_Institution :
Fraunhofer Inst. for Exp. Software Eng., Kaiserslautern, Germany
Volume :
2
fYear :
2010
fDate :
2-8 May 2010
Firstpage :
119
Lastpage :
128
Abstract :
Defining strategies on how to perform quality assurance (QA) and how to control such activities is a challenging task for organizations developing or maintaining software and software-intensive systems. Planning and adjusting QA activities could benefit from accurate estimations of the expected defect content of relevant artifacts and the effectiveness of important quality assurance activities. Combining expert opinion with commonly available measurement data in a hybrid way promises to overcome the weaknesses of purely data-driven or purely expert-based estimation methods. This article presents a case study of the hybrid estimation method HyDEEP for estimating defect content and QA effectiveness in the telecommunication domain. The specific focus of this case study is the use of the method for gaining quantitative predictions. This aspect has not been empirically analyzed in previous work. Among other things, the results show that for defect content estimation, the method performs significantly better statistically than purely data-based methods, with a relative error of 0.3 on average (MMRE).
Keywords :
data analysis; expert systems; quality assurance; quality control; software quality; HyDEEP; QA activity; data-based method; defect content estimation; defect prediction; expert data; expert-based estimation method; hybrid estimation method; measurement data; quality assurance; quality control; software intensive system; telecommunication domain; Context; Context modeling; Data models; Equations; Estimation; Planning; Predictive models; HyDEEP; defect content; effectiveness; hybrid estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering, 2010 ACM/IEEE 32nd International Conference on
Conference_Location :
Cape Town
ISSN :
0270-5257
Print_ISBN :
978-1-60558-719-6
Type :
conf
DOI :
10.1145/1810295.1810313
Filename :
6062145
Link To Document :
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