DocumentCode
2076126
Title
Enhanced SWIFT acquisition with chaotic compressed sensing by designing the measurement matrix with hyperbolic-secant signals
Author
Truong Minh-Chinh ; Tan Tran-Duc ; Nguyen Linh-Trung ; Luong, Marie ; Do, Minh N.
Author_Institution
Fac. Electron. & Telecommun., Vietnam Nat. Univ., Hanoi, Vietnam
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
380
Lastpage
383
Abstract
Sweep imaging Fourier transform (SWIFT) is an efficient (fast and quiet) specialized magnetic resonance imaging (MRI) method for imaging tissues or organs that give only short-lived signals due to fast spin-spin relaxation rates. Based on the idea of compressed sensing, this paper proposes a novel method for further enhancing SWIFT using chaotic compressed sensing (CCS-SWIFT). With reduced number of measurements, CCS-SWIFT effectively faster than SWIFT. In comparison with a recently proposed chaotic compressed sensing method for standard MRI (CCS-MRI), simulation results showed that CCS-SWIFT outperforms CCS-MRI in terms of the normalized relative error in the image reconstruction and the probability of exact reconstruction.
Keywords
Fourier transforms; biological organs; biological tissues; biomedical MRI; chaos; compressed sensing; image enhancement; image reconstruction; medical image processing; probability; spin-spin relaxation; MRI; chaotic compressed sensing; enhanced SWIFT acquisition; exact reconstruction probability; hyperbolic-secant signals; image reconstruction; measurement matrix designing; normalized relative error; organ imaging; short-lived signals; specialized magnetic resonance imaging; spin-spin relaxation rates; sweep imaging Fourier transform; tissue imaging; Compressed sensing; Frequency modulation; Image reconstruction; Magnetic resonance imaging; Radio frequency; Standards; Data Compression; Fourier Analysis; Humans; Image Processing, Computer-Assisted; Magnetic Resonance Imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6345948
Filename
6345948
Link To Document