Title :
Mathematical model of predicting and managing radio transmitting devices manufacturing risk
Author :
Likhanov, Yuri M. ; Likhanov, Dmitry Yu ; Vilmitski, D.S.
Author_Institution :
Novosibirsk State Tech. Univ., Russia
Abstract :
The mathematical probability-based model of predicting and managing radio transmitting devices manufacturing risk is described.
Keywords :
probability; radio transmitters; risk analysis; semiconductor device manufacture; manufacturing risk; mathematical model; probability-based model; radio transmitting devices; Circuits; Consumer electronics; Cutoff frequency; Impedance matching; Mathematical model; Radio spectrum management; Risk analysis; Risk management; Virtual manufacturing; Workability;
Conference_Titel :
Electron Devices and Materials, 2002. Proceedings. 3rd Annual 2002 Siberian Russian Workshop on
Print_ISBN :
5-7782-0380-2
DOI :
10.1109/SREDM.2002.1024332
