Title :
FET Modelling using an Analytic Extraction Method Based on Broadband S-Parameter Measurement
Author :
Kompa, G. ; Lin, F.
Author_Institution :
Dept. of High Frequency Eng., University of Kassel-GhK, Kassel, FRG.
Abstract :
A fully analytical model parameter extraction with respect to microwave FET devices is under investigation using only "hot" scattering parameters over a wide frequency bandwidth. The stability of the proposed extraction algorithm is tested. Some preliminary extracted results from measured data are presented.
Keywords :
Analytical models; Bandwidth; Data mining; Frequency; Microwave FETs; Microwave devices; Parameter extraction; Scattering parameters; Stability; Testing;
Conference_Titel :
Microwave Conference, 1990. 20th European
Conference_Location :
Budapest, Hungary
DOI :
10.1109/EUMA.1990.336138
