• DocumentCode
    2076412
  • Title

    Solid state power control for high power microwave systems

  • Author

    Casey, J. ; Marcel, P.J. ; Gaudreau, P.E. ; Mulvaney, J.M. ; Kempkes, M.A.

  • Author_Institution
    Diversified Technol. Inc., Bedford, MA, USA
  • fYear
    2000
  • fDate
    2-4 May 2000
  • Abstract
    Conditioning, test, and operation of high power microwave tubes, such as klystrons and gyrotrons, is a complex process. These tubes must be conditioned over increasing voltages and input power levels to achieve reliable performance without damage to the tubes themselves. Effective conditioning requires the capability to control voltage, pulsewidth, and PRF precisely at very high power (20 MW +) and voltage (100 kV +). Most traditional modulator technologies typically use vacuum or gas-filled tubes for control, alone or in combination with pulse forming networks. These tube-based systems, though capable of switching at high power levels, are limited in their flexibility. Further, they require significant operator expertise and start-up time to reach full performance. The tube testing and conditioning processes offer an excellent target for simplification and cost reduction. To address these issues in high power, microwave system control, Diversified Technologies, Inc. (DTI) has developed a unique high power, solid state switching technology.
  • Keywords
    electron tube testing; gyrotrons; klystrons; power control; 100 kV; 20 MW; Diversified Technologies; PRF; conditioning processes; gyrotrons; high power microwave systems; input power levels; klystrons; microwave tubes; pulsewidth; solid state power control; tube testing; Gyrotrons; Klystrons; Microwave technology; Power control; Power system reliability; Pulse modulation; Solid state circuits; Space vector pulse width modulation; Testing; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2000. Abstracts. International
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-5987-9
  • Type

    conf

  • DOI
    10.1109/OVE:EC.2000.847525
  • Filename
    847525