Title :
A New Approach to Nonlinear Modelling and Simulation of MESFETs and MODFETs
Author :
Sldzlk, Hardy ; Wolff, Ingo
Author_Institution :
Duisburg University, Department of Electrical Engineering and SFB 254, Bismarckstr. 69, D-4100 Duisburg 1, FRG
Abstract :
A new method for the derivation of a FET-equivalent-circuit for large- and small-signal applications is presented. The model consists of nine bias-dependent intrinsic elements additionally eight linear extrinsic elements. All circuit-elements are determined from measured DC- and scattering-parameters with an analytical method at any bias-condition. The nonlinear behaviour of the intrinsic elements are expressed using two-dimensional spline-functions. The large-signal simulation considers all nonlinear intrinsic elements including the Schottky-diodes and the gate-drain avalanche breakdown.
Keywords :
Capacitance; Circuit simulation; Electrical resistance measurement; FETs; Frequency; HEMTs; MESFETs; MODFET circuits; Roentgenium; Scattering;
Conference_Titel :
Microwave Conference, 1990. 20th European
Conference_Location :
Budapest, Hungary
DOI :
10.1109/EUMA.1990.336139