• DocumentCode
    2076433
  • Title

    Pipeline muffling and a priori current ramping: architectural techniques to reduce high-frequency inductive noise

  • Author

    Powell, Michael D. ; Vijaykumar, T.N.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2003
  • fDate
    25-27 Aug. 2003
  • Firstpage
    223
  • Lastpage
    228
  • Abstract
    While circuit and package designers have addressed microprocessor inductive noise issues in the past, multi-gigahertz clock frequencies and billion-transistor-level integration are exacerbating the problem, necessitating microarchitectural solutions. The large net on-die decoupling capacitance used to address this noise throughout the chip consumes substantial area and can cause a large leakage current. This paper proposes microarchitectural techniques to reduce high-frequency current variability, reducing the need for decoupling capacitors. We observe that we can control inductive noise by reducing current variability either in space (i.e., variability in usage of circuit blocks) or in time (i.e., variability within a circuit block across clock cycles). We propose pipeline muffling, a novel technique to reduce changes in the number of resources being utilized by controlling instruction issue, trading off some energy and performance to control di/dt in space. We also extend a previous technique, which incurs performance and energy degradation, and propose a priori current ramping to allow the current of a resource to ramp up ahead of usage, with virtually no performance loss, and ramp down immediately after usage, with little energy loss. Our techniques guarantee a worst-case bound on the di/dt, which is required to reduce the demand for decoupling capacitors, saving area and reducing leakage.
  • Keywords
    capacitance; integrated circuit design; integrated circuit noise; integrated circuit reliability; leakage currents; microprocessor chips; parallel architectures; pipeline processing; a priori current ramping; architectural techniques; billion-transistor-level integration; high-frequency current variability; high-frequency inductive noise; inductive noise control; instruction issue control; leakage current; microarchitectural solutions; microprocessor inductive noise; multi-gigahertz clock frequencies; net on-die decoupling capacitance; pipeline muffling; reliability; Capacitors; Circuit noise; Clocks; Frequency; Microarchitecture; Microprocessors; Noise reduction; Packaging; Performance loss; Pipelines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design, 2003. ISLPED '03. Proceedings of the 2003 International Symposium on
  • Print_ISBN
    1-58113-682-X
  • Type

    conf

  • DOI
    10.1109/LPE.2003.1231866
  • Filename
    1231866