• DocumentCode
    2076454
  • Title

    Plasma diagnostics for monitoring and control

  • Author

    Braithwaite, N.St.J. ; Phillips, H.J. ; Hopgood, A.A. ; Picton, P.D.

  • Author_Institution
    Oxford Res. Unit, Open Univ., Oxford, UK
  • fYear
    1995
  • fDate
    34788
  • Firstpage
    42583
  • Lastpage
    42585
  • Abstract
    As part of manufacturing optimisation, there is a need for a suite of diagnostics able to monitor relevant plasma and surface parameters working within a framework capable of making intelligent deductions and directing appropriate actions. This report concerns the use of an artificial intelligence (AI) approach to plasma process control using a number of plasma diagnostics in situ surface diagnostics could easily be incorporated, but are not considered here. Specific examples are taken from a project concerned with AI control of the deposition of carbonaceous films from a radio frequency plasma
  • Keywords
    intelligent control; plasma diagnostics; plasma-wall interactions; process control; artificial intelligence approach; plasma diagnostics control; plasma diagnostics monitoring;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Application of Plasma Technology to Surface Processing - Recent Developments in Modelling and Diagnostics for Process Control and Optimization, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19950908
  • Filename
    473072