Title :
Plasma diagnostics for monitoring and control
Author :
Braithwaite, N.St.J. ; Phillips, H.J. ; Hopgood, A.A. ; Picton, P.D.
Author_Institution :
Oxford Res. Unit, Open Univ., Oxford, UK
Abstract :
As part of manufacturing optimisation, there is a need for a suite of diagnostics able to monitor relevant plasma and surface parameters working within a framework capable of making intelligent deductions and directing appropriate actions. This report concerns the use of an artificial intelligence (AI) approach to plasma process control using a number of plasma diagnostics in situ surface diagnostics could easily be incorporated, but are not considered here. Specific examples are taken from a project concerned with AI control of the deposition of carbonaceous films from a radio frequency plasma
Keywords :
intelligent control; plasma diagnostics; plasma-wall interactions; process control; artificial intelligence approach; plasma diagnostics control; plasma diagnostics monitoring;
Conference_Titel :
Application of Plasma Technology to Surface Processing - Recent Developments in Modelling and Diagnostics for Process Control and Optimization, IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19950908