Title :
An experimental apparatus to simulate for air pollution on electrical contacts
Author :
Tanii, Takuya ; Takamatsu, Kuniyoshi ; Kokubu, Yasuyuki
Author_Institution :
Kanazawa Inst. of Technol., Ishikawa, Japan
Abstract :
Ammonium sulfate has been found on the failed contacts for the speech path of the XS-type cross-bar switch in electronic switching systems. The explanation for this is that the ammonium sulfate was formed by SO/sub 2/ gas in the polluted atmosphere and NH/sub 3/ gas emitted from the electromagnetic relays in the system. Simulation experiments free of harmful gases are described in this paper. It is noticed that an ultrasonic humidifier can generate not only pure water mist but also solution mist. If the solution involved ammonium sulfate, mist containing ammonium sulfate would be generated. After introducing the ammonium sulfate mist into dry air, fine particles of solid state ammonium sulfate may be deposited. Several kinds of materials were exposed to the atmosphere containing ammonium sulfate using experimental equipment to simulate air pollution on the electrical contacts. The kinds of exposed materials are noble contact metals such as Au, Ag, Pd, Pt, PGS and other alloys, and a few base metals such as Al, phosphor bronze, and stainless steel.
Keywords :
air pollution; electrical contacts; environmental degradation; environmental testing; materials testing; simulation; surface contamination; Ag; Al; Au; CuSnP; FeCrC; NH/sub 3/; NH/sub 3/ gas; PGS; Pd; Pt; SO/sub 2/; XS-type cross-bar switch; air pollution simulation apparatus; electrical contacts; electromagnetic relays; electronic switching systems; failed contacts; noble contact metals; phosphor bronze; polluted atmosphere; stainless steel; ultrasonic humidifier; Air pollution; Atmosphere; Atmospheric modeling; Contacts; Electronic switching systems; Gases; Relays; Speech; Switches; Water pollution;
Conference_Titel :
Electrical Contacts, 1996. Proceedings of the Forty-Second IEEE Holm Conference on ??. Joint with the 18th International Conference on Electrical Contacts
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-3578-3
DOI :
10.1109/HOLM.1996.557226