DocumentCode :
2076851
Title :
Simulation of noise-power ratio with the large-signal code CHRISTINE
Author :
Safier, P.N. ; Abe, D.K. ; Antonsen, T.M. ; Danly, B.G. ; Levush, B.
Author_Institution :
SAIC, Naval Res. Lab., Washington, DC, USA
fYear :
2000
fDate :
2-4 May 2000
Abstract :
Noise-power ratio (NPR) is a criterion for evaluating the performance of amplifiers and other nonlinear circuits with regard to intermodulation distortion. Traveling-wave tubes (TWTs) are used as amplifiers in telecommunications, and NPR is one of the specifications to be met when building a particular device. Because NPR is measured after a device is built, the meeting of a particular NPR specification may require several build-test cycles. Large-signal, multi-frequency numerical codes to simulate TWT amplifiers, such as CHRISTINE, have the potential to simulate NPR measurements, and thus shorten the design phase of a TWT by reducing, or eliminating altogether, the several build-test cycles required to meet a particular NPR specification. Here we present simulations of the NPR for a helix traveling-wave tube (TWT), performed with the large-signal, l-D, multi-frequency code CHRISTINE, and a comparison with experiment. The results indicate that NPR simulations with large-signal codes have the potential to shorten the design phase of TWTs by eliminating the need for repeated build-test cycles to meet a required NPR.
Keywords :
digital simulation; electrical engineering computing; electron device noise; intermodulation distortion; travelling wave amplifiers; travelling wave tubes; 1D multifrequency numerical code; CHRISTINE; IMD; NPR specification; TWT amplifiers; TWTA; amplifier performance evaluation; helix TWT; intermodulation distortion; large-signal code; noise-power ratio simulation; traveling-wave tubes; Buildings; Circuit noise; Circuit simulation; Distortion measurement; Intermodulation distortion; Nonlinear circuits; Numerical simulation; Particle measurements; Phase measurement; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference, 2000. Abstracts. International
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5987-9
Type :
conf
DOI :
10.1109/OVE:EC.2000.847542
Filename :
847542
Link To Document :
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