DocumentCode
2076876
Title
Application of immune clustering algorithm to analog circuit fault diagnosis
Author
YanFei, Li ; JinZeng, Chen ; ZhiYang, Pang
Author_Institution
Coll. of Naval Archit. & Power, Naval Univ. of Eng., Wuhan, China
fYear
2011
fDate
16-18 Dec. 2011
Firstpage
1743
Lastpage
1746
Abstract
As a new type of pattern recognition method, the immune clustering algorithm is successfully applied to deal with analog circuit fault diagnosis problem. Firstly, exact the fault characteristics of the circuit based on principal component analysis method. Then, calculate the clustering center as the antibody of each circuit status based on clone selection algorithm, which is so-called immunological tolerance. Lastly, regarding the testing sample as antigen, estimate the circuit status through antigen-antibody discrimination. The results show that this fault diagnosis method has high fault-coverage rate, and is easy to realize.
Keywords
analogue circuits; artificial immune systems; fault diagnosis; pattern clustering; principal component analysis; analog circuit fault diagnosis; antigen-antibody discrimination; clone selection algorithm; clustering center; fault-coverage rate; immune clustering algorithm; immunological tolerance; pattern recognition; principal component analysis; Analog circuits; Circuit faults; Cloning; Clustering algorithms; Fault diagnosis; Immune system; Testing; analog circuit; artificial immune system; fault diagnosis;
fLanguage
English
Publisher
ieee
Conference_Titel
Transportation, Mechanical, and Electrical Engineering (TMEE), 2011 International Conference on
Conference_Location
Changchun
Print_ISBN
978-1-4577-1700-0
Type
conf
DOI
10.1109/TMEE.2011.6199549
Filename
6199549
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