DocumentCode :
2076876
Title :
Application of immune clustering algorithm to analog circuit fault diagnosis
Author :
YanFei, Li ; JinZeng, Chen ; ZhiYang, Pang
Author_Institution :
Coll. of Naval Archit. & Power, Naval Univ. of Eng., Wuhan, China
fYear :
2011
fDate :
16-18 Dec. 2011
Firstpage :
1743
Lastpage :
1746
Abstract :
As a new type of pattern recognition method, the immune clustering algorithm is successfully applied to deal with analog circuit fault diagnosis problem. Firstly, exact the fault characteristics of the circuit based on principal component analysis method. Then, calculate the clustering center as the antibody of each circuit status based on clone selection algorithm, which is so-called immunological tolerance. Lastly, regarding the testing sample as antigen, estimate the circuit status through antigen-antibody discrimination. The results show that this fault diagnosis method has high fault-coverage rate, and is easy to realize.
Keywords :
analogue circuits; artificial immune systems; fault diagnosis; pattern clustering; principal component analysis; analog circuit fault diagnosis; antigen-antibody discrimination; clone selection algorithm; clustering center; fault-coverage rate; immune clustering algorithm; immunological tolerance; pattern recognition; principal component analysis; Analog circuits; Circuit faults; Cloning; Clustering algorithms; Fault diagnosis; Immune system; Testing; analog circuit; artificial immune system; fault diagnosis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transportation, Mechanical, and Electrical Engineering (TMEE), 2011 International Conference on
Conference_Location :
Changchun
Print_ISBN :
978-1-4577-1700-0
Type :
conf
DOI :
10.1109/TMEE.2011.6199549
Filename :
6199549
Link To Document :
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