Title :
Reverse engineering with the reclipse tool suite
Author :
Von Detten, Markus ; Meyer, Matthias ; Travk, Dietrich
Author_Institution :
Dept. of Comput. Sci., Univ. of Paderborn, Paderborn, Germany
Abstract :
Design pattern detection is a reverse engineering methodology that helps software engineers to analyze and understand legacy software by recovering its design and thereby aiding in the preparation of re-engineering activities. We present Reclipse, a reverse engineering tool suite for static and dynamic design pattern detection in combination with a pattern candidate rating used to assess the detection results´ reliability.
Keywords :
reverse engineering; software architecture; software tools; dynamic design pattern detection; legacy software engineer; reclipse tool suite; reengineering activity; reverse engineering; static design pattern detection; Educational institutions; Pattern matching; Reverse engineering; Runtime; Software systems;
Conference_Titel :
Software Engineering, 2010 ACM/IEEE 32nd International Conference on
Conference_Location :
Cape Town
Print_ISBN :
978-1-60558-719-6
DOI :
10.1145/1810295.1810360
