Title :
IEEE-1149.1 use in design for verification and testability at Texas Instruments
Author_Institution :
Texas Instrum., Waltham, MA, USA
Abstract :
Products aimed at standardization and cost reduction of IC and system test and debug, compatible with the JTAG/IEEE-1149.1 scan protocols and standards, are discussed. Included are ASIC (application-specific integrated circuit) cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. Tradeoffs to be looked at when using the JTAG/IEEE-1149.1 standard for ASIC are evaluated
Keywords :
application specific integrated circuits; automatic testing; computer interfaces; integrated circuit testing; protocols; standards; ASIC; IBM compatibles; IC testing; JTAG/IEEE-1149.1 standard; Texas Instruments; bus master IC; controller interface board; cost reduction; design for testability; design for verification; high-speed scan interface; scan bus; scan protocols; standard interface ICs; standardization; Application specific integrated circuits; Circuit testing; Electronic equipment testing; Instruments; Integrated circuit testing; Logic devices; Pattern analysis; Protocols; Standardization; System testing;
Conference_Titel :
ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE
Conference_Location :
Rochester, NY
DOI :
10.1109/ASIC.1989.123190
