IEEE-1149.1 use in design for verification and testability at Texas Instruments

Author

Cron, Adam D.

Author_Institution

Texas Instrum., Waltham, MA, USA

fYear

1989

fDate

25-28 Sep 1989

Lastpage

38353

Abstract

Products aimed at standardization and cost reduction of IC and system test and debug, compatible with the JTAG/IEEE-1149.1 scan protocols and standards, are discussed. Included are ASIC (application-specific integrated circuit) cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus. Tradeoffs to be looked at when using the JTAG/IEEE-1149.1 standard for ASIC are evaluated

Keywords

application specific integrated circuits; automatic testing; computer interfaces; integrated circuit testing; protocols; standards; ASIC; IBM compatibles; IC testing; JTAG/IEEE-1149.1 standard; Texas Instruments; bus master IC; controller interface board; cost reduction; design for testability; design for verification; high-speed scan interface; scan bus; scan protocols; standard interface ICs; standardization; Application specific integrated circuits; Circuit testing; Electronic equipment testing; Instruments; Integrated circuit testing; Logic devices; Pattern analysis; Protocols; Standardization; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE

Conference_Location

Rochester, NY

Type

conf

DOI

10.1109/ASIC.1989.123190

Filename

123190