DocumentCode :
2077330
Title :
Grid-controlled 100-kV electron-beam source for SCALPEL [lithography]
Author :
Katsap, V. ; Waskiewicz, W.K. ; Sewell, P.B. ; Rouse, J.A. ; Read, F.H.
Author_Institution :
Lucent Technol., Murray Hill, NJ, USA
fYear :
2000
fDate :
2-4 May 2000
Abstract :
Results show that, with the grid-controlled gun, uniform beam profile can be obtained using nonuniform surface cathode. One can conclude that a traditional polished tantalum emitter might be replaced with more efficient, long lasting one in the SCALPEL grid-controlled gun. Both modeling and experimental results show the possibility of building a 100 kV electron beam source providing high-current, high-emittance, uniform electron beam for the high throughput SCALPEL exposure tool.
Keywords :
cathodes; electron beam lithography; electron guns; 100 kV; SCALPEL; electron beam lithography; exposure tool; grid-controlled electron-beam source; grid-controlled gun; high-current beam; high-emittance beam; nonuniform surface cathode; uniform beam profile; uniform electron beam; Brightness; Cathodes; Crystallization; Current control; Current density; Electron beams; Electron emission; Heating; Lithography; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference, 2000. Abstracts. International
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5987-9
Type :
conf
DOI :
10.1109/OVE:EC.2000.847556
Filename :
847556
Link To Document :
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