Title :
An event-driven transient simulation algorithm for MOS and bipolar circuits
Author :
Patrick, D. ; Lyden, C.
Author_Institution :
Nat. Microelectron. Res. Center, Cork, Ireland
Abstract :
SUGAR is a program for fast transient simulation of MOS circuits The paper describes the extension to the algorithm to handle bipolar and BiCMOS circuits. The authors believe that SUGAR is the first event driven circuit simulator which successfully simulates bipolar circuits. The algorithm uses both dynamic and static circuit partitioning to identify closely coupled nodes, and performs simultaneous equation solutions on the coupled nodes. A number of other extensions have been made to the algorithm to facilitate BJT simulations
Keywords :
BIMOS integrated circuits; CMOS integrated circuits; bipolar integrated circuits; circuit analysis computing; BJT simulations; BiCMOS circuits; MOS circuits; SUGAR; bipolar circuits; closely coupled nodes; dynamic circuit partitioning; event driven circuit simulator; event-driven transient simulation algorithm; simultaneous equation solutions; static circuit partitioning; Analog circuits; Capacitance; Circuit simulation; Coupling circuits; Delay; Discrete event simulation; Partitioning algorithms; SPICE; Timing; Voltage;
Conference_Titel :
Design Automation Conference, 1990., EDAC. Proceedings of the European
Conference_Location :
Glasgow
Print_ISBN :
0-8186-2024-2
DOI :
10.1109/EDAC.1990.136650
