DocumentCode :
2077581
Title :
Processing diagrams for polymeric die attach adhesives
Author :
Hsiung, J.-C. ; Pearson, R.A.
Author_Institution :
Dept. of Mater. Sci. & Eng., Lehigh Univ., Bethlehem, PA, USA
fYear :
1997
fDate :
18-21 May 1997
Firstpage :
536
Lastpage :
543
Abstract :
With a processing diagram, one can reduce the effort required to customize curing process conditions for polymeric die attach adhesives. Polymeric die attach adhesives are often cured per the manufacturer´s recommendations during initial screening evaluations. In most cases, the recommended cure schedules have to be modified so as to fit differences in process equipment. Unfortunately, the modified cure schedule is usually determined by a trial-and-error method. An aim of our experiments is to understand the curing process of a wide range of polymeric die attach adhesives (conventional, fast, and snap cure adhesives) and to construct a processing diagram, i.e. “Bondability Diagram”, so as to define the processing window. Such diagrams should be helpful in determining both the time and cure temperature required to produce high quality bonds. The bondability diagram can be constructed based on fundamental understandings of the phenomena involved in the curing process using a wide variety of tools. Differential Scanning Calorimetry (DSC) is utilized to study the cure kinetic and extent of reaction. Dynamic Mechanical Analysis (DMA) is used to determine gelation times and melt viscosity under a shear mode. A modified Rheovibron is employed to perform cure characterizations under a tensile mode so that cure stresses could be determined. Thermogravimetric Analysis (TGA) is used to evaluate the outgassing phenomena. Optical Microscopy (OM) is used to detect voids. Results indicate that cure behaviors of conventional, fast, and snap cure adhesives are different in several respects. The combination of DSC, DMA, TGA, OM, and lap shear test leads to a frame work of developing the bondability diagram concept. The bondability diagram concept provides a foundation for an understanding of the recommended cure schedule and allows one to design a suitable cure schedule
Keywords :
adhesion; microassembling; optical microscopy; polymers; thermal analysis; Rheovibron; bondability diagram; cure kinetic; cure temperature; curing process conditions; differential scanning calorimetry; dynamic mechanical analysis; gelation times; lap shear test; melt viscosity; optical microscopy; outgassing phenomena; polymeric die attach adhesives; processing diagram; screening evaluations; shear mode; tensile mode; thermogravimetric analysis; voids; Bonding; Calorimetry; Curing; Job shop scheduling; Manufacturing; Microassembly; Optical microscopy; Polymers; Temperature; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location :
San Jose, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-3857-X
Type :
conf
DOI :
10.1109/ECTC.1997.606220
Filename :
606220
Link To Document :
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