Title :
An experimental approach to analog fault models
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
A comprehensive approach to model faults in analog circuits and systems based on experimental statistics of manufacturing defects is presented. A case study based on a simple sample-and-hold circuit is discussed with specific results. It is shown that the digital fault models are applicable to analog and mixed-signal circuits but they account only for catastrophic faults. Out-of-specification faults occur as often as catastrophic faults and must be addressed in any DFT (discrete Fourier transform) technique or test generation algorithm
Keywords :
analogue circuits; fast Fourier transforms; fault location; DFT; analog fault models; catastrophic faults; discrete Fourier transform; experimental statistics; manufacturing defects; out-of-specification faults; sample-and-hold circuit; test generation algorithm; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Fabrication; Semiconductor device modeling; Solid modeling; Statistical distributions; System testing; Virtual manufacturing;
Conference_Titel :
Custom Integrated Circuits Conference, 1991., Proceedings of the IEEE 1991
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0015-7
DOI :
10.1109/CICC.1991.164061
