• DocumentCode
    2077651
  • Title

    High-density surface EMG decomposition based on a convolutive blind source separation approach

  • Author

    Xiangjun Zhu ; Yingchun Zhang

  • Author_Institution
    Zhijiang Coll., Zhejiang Univ. of Technol., Hangzhou, China
  • fYear
    2012
  • fDate
    Aug. 28 2012-Sept. 1 2012
  • Firstpage
    609
  • Lastpage
    612
  • Abstract
    A novel automatic approach is developed in the present study to decompose high density surface electromyography (EMG) signals into motor unit (MU) firing patterns. The observed surface EMG signals are first modeled as a convolutive mixture of active MU sources. Contrast function maximization is employed to extract the first source, and separation of other sources is then carried out by an iterative deflation approach. Each extracted source is further processed and verified with the characteristics of motor unit action potential and firing patterns. The performance of the proposed automatic approach is evaluated in well-designed computer simulation. Results show that 4.7±0.5 and 7.1±0.6 MUs were correctly identified in the case of 5 and 10 active MUs respectively.
  • Keywords
    blind source separation; electromyography; medical signal processing; optimisation; automatic approach; contrast function maximization; convolutive blind source separation approach; extracted source; high density surface electromyography signals; high-density surface EMG decomposition; iterative deflation approach; motor unit action potential; motor unit firing patterns; surface EMG signals; well-designed computer simulation; Blind source separation; Educational institutions; Electric potential; Electrodes; Electromyography; Muscles; Surface treatment; Action Potentials; Algorithms; Computer Simulation; Electromyography; Humans; Models, Neurological; Motor Neurons; Muscles; Signal Processing, Computer-Assisted;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4119-8
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2012.6346005
  • Filename
    6346005