DocumentCode :
2077721
Title :
An incremental methodology for quantitative software architecture evaluation with probabilistic models
Author :
Meedeniya, Indika
Author_Institution :
Fac. of ICT, Swinburne Univ. of Technol., Hawthom, VIC, Australia
Volume :
2
fYear :
2010
fDate :
2-8 May 2010
Firstpage :
339
Lastpage :
340
Abstract :
Probabilistic models are crucial in the quantification of non-functional attributes in safety-and mission-critical software systems. These models are often re-evaluated in assessing the design decisions. Evaluation of such models is computationally expensive and exhibits exponential complexity with the problem size. This research aims at constructing an incremental quality evaluation framework and delta evaluation scheme to address this issue. The proposed technique will provide a computational advantage for the probabilistic quality evaluations enabling their use in automated design space exploration by architecture optimization algorithms. The expected research outcomes are to be validated with a range of realistic architectures and case studies from automotive industry.
Keywords :
automobile industry; optimisation; probability; safety-critical software; software architecture; software quality; architecture optimization algorithm; automated design space exploration; automotive industry; computational advantage; delta evaluation scheme; design decision; exponential complexity; incremental methodology; incremental quality evaluation framework; mission-critical software system; nonfunctional attribute quantification; probabilistic model; probabilistic quality evaluation; quantitative software architecture evaluation; realistic architecture; safety-critical software system; Computational modeling; Computer architecture; Markov processes; Mathematical model; Optimization; Probabilistic logic; Reliability; architecture evaluation; delta evaluation; incremental evaluation models; probabilistic properties;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering, 2010 ACM/IEEE 32nd International Conference on
Conference_Location :
Cape Town
ISSN :
0270-5257
Print_ISBN :
978-1-60558-719-6
Type :
conf
DOI :
10.1145/1810295.1810382
Filename :
6062204
Link To Document :
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