Title :
Test considerations for mixed analog and digital ASICs
Author_Institution :
Motorola GmbH, Munich, West Germany
Abstract :
An examination is made of some of the factors affecting testability of mixed analog and digital ASIC (application-specific integrated circuit) standard cells. The influence of process characterization, accurate simulation models, and partitioning of digital and analog circuitry is discussed. In addition, the digitizing of the functionality of analog cells and applying testing strategies for complex digital systems are considered. Analog parameters which can be measured with a digital VLSI tester are also described
Keywords :
application specific integrated circuits; automatic testing; cellular arrays; integrated circuit testing; monolithic integrated circuits; ASIC; analogue parameters; analogue/digital ICs; digitizing; functionality; mixed technology; partitioning; process characterization; simulation models; standard cells; testability; testing strategies; Application specific integrated circuits; Automatic testing; Circuit simulation; Circuit testing; Costs; Design for testability; Logic testing; Semiconductor device modeling; Silicon; Very large scale integration;
Conference_Titel :
ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE
Conference_Location :
Rochester, NY
DOI :
10.1109/ASIC.1989.123193
