DocumentCode
2077983
Title
Test considerations for mixed analog and digital ASICs
Author
Hahn, Reinhard
Author_Institution
Motorola GmbH, Munich, West Germany
fYear
1989
fDate
25-28 Sep 1989
Lastpage
38078
Abstract
An examination is made of some of the factors affecting testability of mixed analog and digital ASIC (application-specific integrated circuit) standard cells. The influence of process characterization, accurate simulation models, and partitioning of digital and analog circuitry is discussed. In addition, the digitizing of the functionality of analog cells and applying testing strategies for complex digital systems are considered. Analog parameters which can be measured with a digital VLSI tester are also described
Keywords
application specific integrated circuits; automatic testing; cellular arrays; integrated circuit testing; monolithic integrated circuits; ASIC; analogue parameters; analogue/digital ICs; digitizing; functionality; mixed technology; partitioning; process characterization; simulation models; standard cells; testability; testing strategies; Application specific integrated circuits; Automatic testing; Circuit simulation; Circuit testing; Costs; Design for testability; Logic testing; Semiconductor device modeling; Silicon; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE
Conference_Location
Rochester, NY
Type
conf
DOI
10.1109/ASIC.1989.123193
Filename
123193
Link To Document