Title :
The outlier process: unifying line processes and robust statistics
Author :
Black, Michael J. ; Rangarajan, Anand
Author_Institution :
Xerox Palo Alto Res. Center, CA, USA
Abstract :
This paper unifies “line-process” approaches for regularization with discontinuities and robust estimation techniques. We generalize the notion of a “line process” to that of an analog “outlier process” and show that a problem formulated in terms of outlier processes can be viewed in terms of robust statistics. We also characterize a class of robust statistical problems for which an equivalent outlier-process formulation exists and give a straightforward method for converting a robust estimation problem into an outlier-process formulation. This outlier-processes approach provides a general framework which subsumes the traditional line-process approaches as well as a wide class of robust estimation problems. Examples in image reconstruction and optical flow are used to illustrate the approach
Keywords :
computer vision; estimation theory; image reconstruction; statistical analysis; surface fitting; image reconstruction; line processes; optical flow; outlier process; outlier-process formulation; robust estimation techniques; robust statistical problems; robust statistics; Estimation; Image reconstruction; Machine vision; Statistics;
Conference_Titel :
Computer Vision and Pattern Recognition, 1994. Proceedings CVPR '94., 1994 IEEE Computer Society Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-8186-5825-8
DOI :
10.1109/CVPR.1994.323805