• DocumentCode
    2078369
  • Title

    Non-conventional characterisation of MV measurement transformers solid insulation systems through analyses of digitally acquired PD patterns

  • Author

    Bozzo, R. ; Centurioni, L. ; Coletti, G. ; Gemme, C. ; Guastavino, F.

  • Author_Institution
    Dept. of Electr. Eng., Genoa Univ., Italy
  • Volume
    1
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    238
  • Abstract
    Partial discharges (PD) digital measurement systems have been recently developed. They supply useful information to implement diagnostics on insulation systems. Such systems output consists of data about the amplitude, the number and the occurrence phase of the PD. Such acquired data (PD patterns) information is contained in 3D matrices and can be processed aiming at the identification of the morphology of defects. This preliminary work is part of a research focused on the “measurements” of defects, possibly present and acting as PD sites, in the insulation system of measurement transformers (VT) for medium voltage (MV), cast-resin type. “Non-conventional” PD testing procedures have been studied and applied acquiring the PD patterns in numerous and different test conditions. The comparative analysis performed on the PD patterns results allowed identification of some relations between the similarity (or the differences) of the examined tested components
  • Keywords
    insulation testing; life testing; partial discharges; power transformer insulation; power transformer testing; 3D matrices; MV measurement transformers; cast-resin type; defect morphology; digitally acquired PD patterns; insulation system diagnostics; occurrence phase; partial discharges; solid insulation systems; test conditions; Dielectrics and electrical insulation; Frequency; Insulation testing; Medium voltage; Morphology; Partial discharges; Performance evaluation; Power transformer insulation; Solids; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    0-7803-3851-0
  • Type

    conf

  • DOI
    10.1109/CEIDP.1997.634603
  • Filename
    634603