DocumentCode :
2078524
Title :
Characterization of a High-TC Superconducting Thin Film by the Ring Resonator Method
Author :
Meisse, P. ; Baudrand, H. ; Chaubet, M. ; Lapierre, L. ; Pyee, M.
Author_Institution :
ENSAE, Laboratoire d´´?lectronique, 10 Av. Edouard Belin, 31400 Toulouse (France)
Volume :
2
fYear :
1990
fDate :
9-13 Sept. 1990
Firstpage :
1234
Lastpage :
1239
Abstract :
We describe the modelization of an experimental set up for a new microwave measurement technique for the characterization of the high critical temperature superconductor (HTCS) thin layer. This approach allows the connexion between HTCS parameters, like surface resistance in microwaves, and experimental measurements. The preliminary results are in good agreements with some previously reported ones.
Keywords :
Electrical resistance measurement; High temperature superconductors; Measurement techniques; Microwave measurements; Microwave theory and techniques; Optical ring resonators; Superconducting epitaxial layers; Superconducting microwave devices; Superconducting thin films; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1990. 20th European
Conference_Location :
Budapest, Hungary
Type :
conf
DOI :
10.1109/EUMA.1990.336235
Filename :
4136172
Link To Document :
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