• DocumentCode
    2078645
  • Title

    Measuring and control method of deformation process of generator´s retaining rings on hydraulic bulging strengthening technology based on virtual instrument

  • Author

    Zhao, Xianling ; Liu, Jiansheng

  • Author_Institution
    Coll. of Electron. Inf. Eng., Taiyuan Univ. of Sci. & Technol., Taiyuan, China
  • Volume
    2
  • fYear
    2010
  • fDate
    10-12 Dec. 2010
  • Firstpage
    1229
  • Lastpage
    1232
  • Abstract
    The hydraulic bulging strengthening technology is a kind of strengthening technology of large generator´s retaining ring. The ring billet is deformed uniformly by the super pressure water while the punch working angle is 60° and the pressure between the punch and the rings is 1MN. In the deformation process the thickness of the ring must be controlled accurately. Using ultrasound sensors which the accuracy can achieve 0.1mm to measure real-time thickness of the ring billet can greatly improve the accuracy. Controlling the pressure of the oil-hydraulic machine and ultra-high pressure pump with virtual instrument may improve productivity. The experiment in 5MN oil-hydraulic machine proves that the external generatrices of the ring billet are nearly line after the thickness deformations of the top, middle and bottom of the ring billet are 1.49mm, 1.69mm and 1.65mm. The ring billet is 1/5 of 300MW18-18 steel retaining ring.
  • Keywords
    billets; deformation; hardening; hydraulic systems; mechanical engineering computing; pumps; punching; rings (structures); ultrasonic applications; virtual instrumentation; deformation process; generator; hydraulic bulging strengthening technology; oil-hydraulic machine; retaining rings; ring billet; ultra-high pressure pump; ultrasound sensors; virtual instrument; Data acquisition; Instruments; Pumps; Ultrasonic variables measurement; LabVIEW; generator´ring; hydraulic bulging strengthening; ultrasound sensors; virtual instrument;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Progress in Informatics and Computing (PIC), 2010 IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-6788-4
  • Type

    conf

  • DOI
    10.1109/PIC.2010.5687917
  • Filename
    5687917