DocumentCode
2079323
Title
Using Data Mining Technology to improve Manufacturing Quality - A Case Study of LCD Driver IC Packaging Industry
Author
Chen, Ruey-Shun ; Yeh, Kun-Chieh ; Chang, Chan-Chine ; Chien, H.H.
Author_Institution
Inst. of Inf. Manage., Nat. Chiao-Tung Univ., Hsinchu
fYear
2006
fDate
19-20 June 2006
Firstpage
115
Lastpage
119
Abstract
In recent year, because of the professional teamwork, to improve the qualification percentage of products, to accelerate the acknowledgement of product defects and to find out the solution, the LCD driver IC packaging factories have to establish an analysis mode for quality problems of product for more effective and quicker acquisition of needed information and to improve the customer´s satisfaction for information system. The past information system used neural network to improve the yield rate of production. In this research employs the star schema of data warehousing as the base of line analysis, and uses decision tree in data mining to establish a quality analysis system for the defects found in the production processes of package factories in order to provide an interface for problem analysis, enabling quick judgment and control over the cause of problem to shorten the time solving the quality problem. The result of research shows that the use of decision tree algorithm reducing the numbers of defected inner leads and chips has been improved, and using decision tree algorithm is more suitable than using neural network in quality problem classification and analysis of the LCD driver IC packaging industry
Keywords
customer satisfaction; data mining; data warehouses; decision trees; driver circuits; electronics industry; information systems; integrated circuit packaging; manufacturing data processing; quality management; LCD driver IC packaging industry; customer satisfaction; data mining technology; data warehousing; decision tree; information system; manufacturing quality; product defects; product quality; professional teamwork; quality analysis system; quality problem analysis; quality problem classification; Data mining; Decision trees; Information systems; Integrated circuit packaging; Manufacturing industries; Mining industry; Neural networks; Production facilities; Production systems; Teamwork; Data mining; Data warehouse; Decision tree.; LCD driver IC packaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, 2006. SNPD 2006. Seventh ACIS International Conference on
Conference_Location
Las Vegas, NV
Print_ISBN
0-7695-2611-X
Type
conf
DOI
10.1109/SNPD-SAWN.2006.75
Filename
1640676
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