Complex electron wave reconstruction using parameter estimation

Author

Van Den Bos, A.

Author_Institution

Fac. of Appl. Phys., Delft Univ. of Technol., Netherlands

Volume

1

fYear

1996

fDate

1996

Firstpage

575

Abstract

A new method is proposed for the reconstruction of the complex valued exit wave of a periodic specimen in a transmission electron microscope. The method uses a series of images recorded at different defoci. From these inherently noisy images the parameters defining the wave are estimated. The method keeps the number of parameters as small as possible. In addition, in simulations, if has been found to always produce the best fitting exit wave estimate to the recorded images

Keywords

Fourier analysis; Poisson distribution; convergence of numerical methods; image reconstruction; image sequences; least squares approximations; maximum likelihood estimation; transfer functions; transmission electron microscopy; 1D images; Poisson distribution; complex Fourier coefficients; complex electron wave reconstruction; complex valued exit wave; convergence; inherently noisy images; initial values; maximum likelihood estimator; modelling; nonlinear optimisation; parameter estimation; periodic specimen; series of images; statistical intensity observations; transfer functions; transmission electron microscope; Bandwidth; Cameras; Electron microscopy; Frequency; Image reconstruction; Maximum likelihood estimation; Parameter estimation; Periodic structures; Reconstruction algorithms; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507448

Filename

507448