• DocumentCode
    2079641
  • Title

    Reverse engineering models from databases to bootstrap application development

  • Author

    Malpani, Ankit ; Bernstein, Philip A. ; Melnik, Sergey ; Terwilliger, James F.

  • Author_Institution
    Indian Inst. of Technol., Madras, Chennai, India
  • fYear
    2010
  • fDate
    1-6 March 2010
  • Firstpage
    1177
  • Lastpage
    1180
  • Abstract
    Object-relational mapping systems have become often-used tools to provide application access to relational databases. In a database-first development scenario, the onus is on the developer to construct a meaningful object layer for the application because shipping tools, as ORM tools only ship database reverse-engineering tools that generate objects with a trivial one-to-one mapping. We built a tool, EdmGen++, that combines pattern-finding rules from conceptual modelling literature with configurable conditions that increase the likelihood that found patterns are semantically relevant. EdmGen++ produces a conceptual model with inheritance in Microsoft´s Entity Data Model, which Microsoft´s Entity Framework uses to support an executable object-to-relational mapping. The execution time of EdmGen++ on customer databases is reasonable for design-time.
  • Keywords
    C++ language; object-oriented databases; relational databases; reverse engineering; EdmGen++ tool; Microsoft entity data model; bootstrap application development; conceptual model; customer databases; database-first development scenario; databases; object-relational mapping systems; one-to-one mapping; relational databases; reverse engineering models; Accidents; Data models; Marine vehicles; Object oriented databases; Object oriented modeling; Pattern matching; Rails; Relational databases; Reverse engineering; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Engineering (ICDE), 2010 IEEE 26th International Conference on
  • Conference_Location
    Long Beach, CA
  • Print_ISBN
    978-1-4244-5445-7
  • Electronic_ISBN
    978-1-4244-5444-0
  • Type

    conf

  • DOI
    10.1109/ICDE.2010.5447776
  • Filename
    5447776