• DocumentCode
    2079824
  • Title

    Electronic packaging and reliability education for the 21st century: the University of Maryland CALCE EPRC Program

  • Author

    Joshi, U. ; Pecht, M. ; Nakayama, W.

  • Author_Institution
    CALCE Center for Electron. Packaging, Maryland Univ., College Park, MD, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    585
  • Lastpage
    588
  • Abstract
    In the 1980´s, University of Maryland faculty began teaching courses on electronic packaging and wrote the first book on this topic. As a result of two subsequent ε grants under the U.S. Government Technology Re-investment Program, the Computer-Aided Life-Cycle Engineering (CALCE) Electronic Packaging Research Center (EPRC), an academic center of the University of Maryland, today provides a cross-disciplinary undergraduate and graduate curriculum on Electronic Packaging and Reliability (EPAR). Offered through the Mechanical Engineering Department, students from all engineering disciplines including Electrical Engineering, Materials Science and Reliability Engineering enroll in the program. The success of the EPAR graduate program is evidenced by the respect it has gained from the electronics industry. All graduates of this program have been keenly sought after, and have enjoyed excellent job opportunities. In the era of dwindling enrollments in many graduate engineering programs, the EPAR program has seen a consistent growth. The instructional methodologies employed in this curriculum development effort are described and can serve as models for other multi-disciplinary programs
  • Keywords
    electronic engineering education; packaging; reliability; CALCE EPRC program; Computer-Aided Life-Cycle Engineering; EPAR; Electronic Packaging Research Center; Electronic Packaging and Reliability; University of Maryland; curriculum development; education; electronic packaging; graduate engineering; multi-disciplinary program; reliability; Books; Computer science education; Curriculum development; Educational programs; Electronics industry; Electronics packaging; Government; Materials science and technology; Mechanical engineering; Reliability engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606229
  • Filename
    606229