• DocumentCode
    2079862
  • Title

    Evaluation of T wave alternans detectors based on a simulation study

  • Author

    Wan, Xiankui ; Xu, Du ; Xie, Fulan

  • Author_Institution
    Inf. Eng. Coll., Guangdong Univ. of Technol., Guangzhou, China
  • Volume
    2
  • fYear
    2010
  • fDate
    10-12 Dec. 2010
  • Firstpage
    1184
  • Lastpage
    1188
  • Abstract
    A simulation study of T wave alternans (TWA) is proposed in order to evaluate the performance of typically used TWA detectors, as well as to quantify the performance characteristics in terms of sensitivity, positive predictivity and beat-to-beat amplitude estimation accuracy. ECG signals are simulated repeating a single beat, and adding mixed noise from 4 different noise sources at different levels. TWA episodes with different amplitudes and waveforms were added to the signals. We can conclude from this study that the correlation-based detector obtained much lower detection rates than the other detectors, especially in sensitivity for low amplitude TWA. The amplitude accuracy in the detected episodes was also found to be the worst with correlation-based detector. The other detectors have shown a similar behavior. However, the complex demodulation detector needs a much higher computational complexity. In general, alternans are detected with rates near 100% for SNR greater than 10 dB for physiological noise sources.
  • Keywords
    amplitude estimation; computational complexity; correlation methods; demodulation; electrocardiography; medical signal detection; neurophysiology; ECG signal; T Wave Alternans Detectors; TWA detectors; beat-to-beat amplitude estimation; complex demodulation detector; computational complexity; correlation-based detector; physiological noise sources; Cardiology; Electrocardiography; Signal to noise ratio; Time domain analysis; T-wave alternans; complex demodulation; correlation method; evaluation; modified moving average method; spectral method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Progress in Informatics and Computing (PIC), 2010 IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-6788-4
  • Type

    conf

  • DOI
    10.1109/PIC.2010.5687979
  • Filename
    5687979